PCE Instruments Profilometer (PCE-RT 2000) is a versatile device for accurate surface roughness measurement. This high-performance profilometer is equipped with an OLED display, a micro USB interface, and a rechargeable Li-ion battery, making it ideal for both laboratory and industrial applications.
The device measures roughness parameters including Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, and Rc, ensuring precise evaluations for quality control. With its intuitive software, real-time graphical representation, and automatic data storage, this profilometer simplifies roughness analysis for various surfaces.
- Specifications and Dimensions
- Measurement Parameters: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc
- Measuring Range (Ra, Rq, Rc): 0.005 μm … 16 μm
- Measuring Range (Rz, Rt, Rp, Rv): 0.02 μm … 200 μm
- Measuring Range (Rsm): 5 μm … 1000 μm
- Measuring Range (Rsk): -1 … 1
- Stylus Tip Radius: 5 μm
- Stylus Tip Material: Diamond (90° angle)
- Max. Recommended Static Measurement Force: 4 mN (0.4 gf)
- Measuring Principle: Inductive
- Radius Longitudinal Guide Bar: 45 mm / 1.8 in
- Maximum Driving Distance: 15 mm / 0.6 in
- Cut-Off Wavelengths:
- 0.135 mm/s at 0.25 mm cut-off
- 0.5 mm/s at 0.8 mm cut-off
- 1 mm/s at 2.5 mm cut-off
- Reversing Speed: 1 mm/s
- Measurement Accuracy: < ± 10%
- Repeatability: <6%
- Display: OLED
- Units: μm / μinch (switchable)
- Interface: Micro USB
- Power Supply: Rechargeable Li-ion Battery
- Key Features and Benefits
- Measures Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, and Rc for detailed roughness analysis
- OLED display for clear real-time graphical and numerical visualization
- Micro USB interface for data transfer and charging
- Three different cutoff wavelengths for varied applications
- Automatic data storage and statistical function for efficient reporting
- Compact, lightweight, and portable design for field and lab use
- Comes with a complete set of accessories, including a calibration plate and roughness standard
